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Feature #258
open
Test pattern with overlay in LSB
Status:
New
Priority:
Low
Assignee:
-
Category:
-
Target version:
-
Start date:
Due date:
% Done:
0%
Estimated time:
Module:
dcmdata/dcmcheck
Operating System:
Compiler:
Description
Develop sample test pattern that contains an overlay in the pixel data LSB
(e.g. bitAllocated=16, bitsStored=12, highBit=11 aber DENNOCH overlayBit=0,
d.h. das "Rauschen" in den Bilddaten ist gleichzeitig ein Overlay.)
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